Automated Line-Based Sequential Sampling and Modeling Algorithm for EMC Near-Field Scanning

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Singh P, Claeys T, Vandenbosch GAE, Pissoort D

IEEE Trans. Electromagn. Compat. 59 (2) 704-709 [2017-04-00; online 2017-04-00]

Prashant Singh

SciLifeLab Fellow

DOI 10.1109/temc.2016.2632741

Crossref 10.1109/temc.2016.2632741