Gong X, Trogh J, Braet Q, Tanghe E, Singh P, Plets D, Hoebeke J, Deschrijver D, Dhaene T, Martens L, Joseph W
IET Science, Measurement & Technology 10 (4) 375-382 [2016-07-00; online 2016-07-00]
DOI 10.1049/iet-smt.2015.0213
Crossref 10.1049/iet-smt.2015.0213